4th Pacific-Rim Symposium on Image and Video Technology (PSIVT'10)
Singapore, November 2010,
http://www.psivt.org/psivt2010/
Pacific-Rim Symposium on Image and Video Technology is a symposia
series which serves to provide a forum for presenting and exploring
the newest research and development in image and video technology.
The symposium will bring together the latest development in both
theoretical and practical aspects of image and video technology,
artistic and consumer innovations. It invites researchers, artists,
developers, educators, performers, and practitioners of image and
video technology from the Pacific Rim and around the world.
High quality contributions from prospective authors are solicited in
all aspects of image and video technology including, but not limited
to:
Image/Video Coding and Transmission:
Image/video compression, error resilient video coding, joint source/
channel coding, low-bit-rate video coding, video streaming over
wireless/wired networks, etc.
Image/Video Processing and Analysis:
Super resolution, image refinement, feature extraction, image
segmentation, motion analysis, tracking, etc.
Image/Video Storage, Retrieval, and Authentication
Image/video retrieval, face or biometric authentication, etc.
Image/Video Formation, Display, and Hardware:
Multispectral or time-of-flight image or video cameras, omni-
directional, panoramic, and multi-view camera design, 3D
visualization hardware, etc.
Multiview Image/Video Coding and Processing:
Stereo and multi-viewpoint image processing, multi-view geometry,
omni-directional and panoramic image processing, etc.
Graphics, Visualization, and Pervasive Computing :
Interaction between graphics and vision, image-based human-computer
interaction, image-based virtual reality techniques, 3D video
generation and editing, 3D visualization techniques and systems, etc.
Scene Recognition and Understanding
Object detection & recognition, event recognition, etc.
Computer Vision Applications:
Video surveillance, visual inspections, intelligent transportation
systems, SLAM and navigation, medical image analysis, etc.
All papers will be subject to a double-blind review process which will
be carried out by at least two experienced researchers in the field.
Accepted and presented papers will be published by IEEE Computer
Society Conference Publishing Service in a CDROM proceedings, and will
be included in IEEE Xplore and CSDL, and indexed by EI Compendex and
ISTP.
Selected papers will be invited to submit an extended version to
special issues in Journals.
Tutorial and Workshop proposals are also invited. Please email to
info@psivt.org for more information.
Keynote speeches will be delivered by renowned experts in image and
video technology at the symposium.
Organizing Committee
General Chairs:
Kap Luk Chan (Nanyang Technological University, Singapore)
Akihiro Sugimoto (National Institute of Informatics, Japan)
Hanqing Lu (NLPR, Chinese Academy of Science, China)
Program Co-Chairs:
Kai-Kuang Ma (Nanyang Technological University, Singapore)
Han Wang (Nanyang Technological University, Singapore)
Yasuyuki Matsushita (Microsoft Research Asia, China)
Invited Session Chair:
Shuicheng Yan (National University of Singapore, Singapore)
Demo/Exhibition Chair:
Kwoh Chee Keong (Nanyang Technological University, Singapore)
Workshop/Tutorial Chair:
Terence Sim (National University of Singapore, Singapore)
Local Arrangement Chair:
Mohammed Yakoob Siyal (Nanyang Technological University, Singapore)
Finance Chair:
Ramakrishna Kakarala (Nanyang Technological University, Singapore)
Publicity Chair:
Liang Tien Chia (Nanyang Technological University, Singapore)
Martin Constable (Nanyang Technological University, Singapore)
Publication Chair:
Liyuan Li (Institute for Infocomm Research, Singapore)
For further information, please visit the conference website:
http://www.psivt.org/psivt2010/
Contact us: info@psivt.org.
Sponsors:
Pattern Recognition and Machine Intelligence Association
Institution of Engineering and Technology, Singapore Network
IS&T/SPIE 23st Annual Symposium
Electronic Imaging 2009
3D Imaging Metrology
(Conference EI114)
23 - 27 January 2010
San Jose Convention Center
San Jose, CA USA
Conference Chairs
J. Angelo Beraldin, National Research Council Canada (Canada);
Geraldine S. Cheok, National Institute of Standards and Technology;
Mike McCarthy, National Physical Lab. (United Kingdom);
Ulrich Neuschaefer-Rube, Physikalisch-Technische Bundesanstalt (Germany)
Program Committee
Burcu Akinci, Carnegie Mellon Univ.;
Jan Boehm, Univ. Stuttgart (Germany);
Robert Emmett Bridges, FARO Technologies Inc.;
Simone Carmignato, Univ. degli Studi di Padova (Italy);
Luc Cournoyer, National Research Council Canada (Canada);
Sabry F. El-Hakim, National Research Council Canada (Canada);
Guy Godin, National Research Council Canada (Canada);
Gabriele Guidi, Politecnico di Milano (Italy);
Darin Ingimarson, Quantapoint, Inc.;
Kenichi Kanatani, Okayama Univ. (Japan);
Derek D. Lichti, Univ. of Calgary (Canada);
Alan M. Lytle, National Institute of Standards and Technology;
Hans-Gerd Maas, Technische Univ. Dresden (Germany);
Masaaki Mochimaru, National Institute of Advanced Industrial Science and Technology (Japan);
Norbert Pfeifer, Technische Univ. Wien (Austria);
Steven D. Phillips, National Institute of Standards and Technology;
Paul W. Reed, The Boeing Co.;
Stuart Robson, Univ. College London (United Kingdom);
Robert Sablatnig, Technische Univ. Wien (Austria);
Kamel S. Saidi, National Institute of Standards and Technology;
Jonathan M. Saint Clair, The Boeing Co.;
Marc-Andre Soucy, InnovMetric Software, Inc. (Canada);
M. George Vosselman, International Institute for Geo-Information Science and Earth Observation (Netherlands);
Gregory C. Walsh, Leica Geosystems HDS, LLC
Due Dates:
Abstract (500 words) and Summary (200 words): 28 June 2010
Manuscript for On-site Proceedings: 15 November 2010
Three-dimensional (3D) imaging systems are now widely available, but
standards, best practices and comparative data are limited. The need for
standards is mainly driven by users and product developers who are
concerned with 1) the applicability of a given system to the task at
hand (fit-for-purpose), 2) the ability to fairly compare across
instruments, 3) instrument warranty issues, 4) costs savings through 3D
imaging. This conference focuses on two topics. The first topic is the
metric performance of 3D imaging sensors and algorithms where the
performance of a system is usually evaluated using quality parameters
such as resolution, uncertainty, accuracy and complexity. Metrology
provides a framework to assess the overall performance of a system in
terms of uncertainty characterization and reporting. The second topic
focuses on the development of standards for 3D imaging systems.
This conference on 3D imaging metrology provides a unique forum for
researchers, developers, users and policy makers to present the latest
advances in 3D imaging and modeling of existing object and sites along
with the most recent work in standard definitions. These 3D measurement
systems, based on high speed, non-contact optical sensors, provide dense
3D surface data. Systems include 3D capture methods that use coded-light
projection systems, triangulation and time-of-flight systems for
distances from a few centimeters to several kilometers. This conference
is in response to the rapidly growing interest in 3D imaging technology
and the increase in demand of such technology and standards in
applications and disciplines such as 3D modeling (e.g., structures,
human body) rapid product development, manufacturing, construction,
forensics, medicine, cultural heritage objects/sites documentation, and
exploration of remote and hazardous sites, to name a few.
We invite submission of original research contributions, state-of-art
summaries, as well as demonstrations of successful and less successful
applications in, but not limited to, the following technical areas:
Performance evaluation of 3D sensing methods, sensor calibration, data
processing and surface modeling
* 3D surface sensing (measurement physics), systems, and methods (e.g., fringe projection, time-of-flight, triangulation, dense stereo methods)
* portable metrology equipment
* advances in calibration techniques
* performance evaluation: artifacts, methodologies, facilities and fundamentals
* freeform metrology
* object and large volume metrology
* measurement of small geometries
* integration and fusion of multiple data sources (CMM, laser trackers, flash lidar, 3D imaging)
* multiview registration and integration
* data processing (e.g. data cleaning)
* modeling of deformable surfaces
* human body scanning and modeling
* validation of computer vision algorithms
* time-resolved 3D-image analysis techniques.
Emerging and new standards for 3D imaging systems
* dimensional standards and their impact (e.g., VDI/VDE 2634, ASTM E57, ISO TC 172, ISO/DIS 10360-8)
* measurement uncertainties & traceability issues
* standards & calibrations at National Metrology Institutes
* best practice (e.g. test cases, in-field checks)
* performance evaluation and calibration facilities
* free-form verification artifacts: construction, surface finish and shape
* education, training and operator capability
* policy making.